Prof. Xuejun Fan Ph.D.
IEEE Fellow and Distinguished Lecturer
Lamar University, Beaumont, Texas, USA
”New Results on Electromigration Modeling – A Departure from Blech’s Theory”
Xuejun Fan is a Regents’ Professor of Texas State University System, and a Mary Ann and Lawrence E. Faust Endowed Professor at Lamar University, Beaumont, Texas. Dr. Fan is an IEEE Fellow, and an IEEE Distinguished Lecturer. He currently serves as a member-at-large of the IEEE Electronic Packaging Society (EPS) Board of Governors. Dr. Fan gained significant experience in the microelectronics industry between 1997 and 2007, at IME, Philips and Intel.